214 search results - page 4 / 43 » Improved Boundary Scan Design |
DAC
2008
ACM
14 years 10 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
BMCBI
2007
13 years 10 months ago
2007
Background: MicroRNAs (miRNAs) are recognized as one of the most important families of noncoding RNAs that serve as important sequence-specific post-transcriptional regulators of ...
ISLPED
2005
ACM
14 years 3 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...