Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
The increasing levels of system integration in Multi-Processor System-on-Chips (MPSoCs) emphasize the need for new design flows for efficient mapping of multi-task applications o...
Reliability analysis has become an integral part of system design and operating. This is especially true for systems performing critical tasks such as mass transportation systems....
Roland Donat, Laurent Bouillaut, Patrice Aknin, Ph...
We present a performance-oriented refinement approach that refines a perfectly synchronous communication model onto Network-on-Chip (NoC) communication. We first identify four bas...
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...