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» Integrating Reliable Memory in Databases
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ICCD
2008
IEEE
157views Hardware» more  ICCD 2008»
14 years 5 months ago
Power-aware soft error hardening via selective voltage scaling
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
Kai-Chiang Wu, Diana Marculescu
ICSE
2009
IEEE-ACM
13 years 6 months ago
VCC: Contract-based modular verification of concurrent C
Most system level software is written in C and executed concurrently. Because such software is often critical for system reliability, it is an ideal target for formal verification...
Markus Dahlweid, Michal Moskal, Thomas Santen, Ste...
DEXAW
2007
IEEE
150views Database» more  DEXAW 2007»
14 years 3 months ago
Compressed Aggregations for mobile OLAP Dissemination
As wireless network infrastructure becomes more reliable, an increasing number of traditional desktop applications, beyond common web browsing, migrate to portable devices. Since ...
Ilias Michalarias, Arkadiy Omelchenko
EDBT
2012
ACM
395views Database» more  EDBT 2012»
11 years 11 months ago
Data management with SAPs in-memory computing engine
We present some architectural and technological insights on SAP’s HANA database and derive research challenges for future enterprise application development. The HANA database m...
Joos-Hendrik Boese, Cafer Tosun, Christian Mathis,...
EDCC
2008
Springer
13 years 10 months ago
A Transient-Resilient System-on-a-Chip Architecture with Support for On-Chip and Off-Chip TMR
The ongoing technological advances in the semiconductor industry make Multi-Processor System-on-a-Chips (MPSoCs) more attractive, because uniprocessor solutions do not scale satis...
Roman Obermaisser, Hubert Kraut, Christian El Sall...