We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
The current paradigm of using Cu interconnects for on-chip global communication is rapidly becoming a serious performance bottleneck in ultra-deep submicron (UDSM) technologies. C...
We consider the problem of performance driven lookup-table (LUT) based technology mapping for FPGAs using a general delay model. In the general delay model, each interconnection e...
We present an integrated approach aimed at predicting layout area needed to implement a behavioral description for a given performance goal. Our approach is novel because: (1) it ...
Seong Yong Ohm, Fadi J. Kurdahi, Nikil Dutt, Min X...