37 search results - page 3 / 8 » Leakage Current Reduction in VLSI Systems |
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Gate oxide tunneling current Igate and sub-threshold current Isub dominate the leakage of designs. The latter depends on threshold voltage Vth while Igate vary with the thickness ...
DATE
2002
IEEE
14 years 17 days ago
2002
IEEE
We present a Dynamic VTH Scaling (DVTS) scheme to save the leakage power during active mode of the circuit. The power saving strategy of DVTS is similar to that of the Dynamic VDD...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Power gating is emerging as a viable solution to reduction of leakage current. However, power gated circuits are different from the conventional designs in the sense that a power-...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
For CMOS technologies below 65nm, gate oxide direct tunneling current is a major component of the total power dissipation. This paper presents a simulated annealing based algorith...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...