In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
As VLSI technology moves to the 65nm node and beyond, interconnect delay greatly limits the circuit performance. As a critical component in interconnect synthesis, layer assignmen...
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
System-on-chip communication architectures have a significant impact on the performance and power consumption of modern multiprocessor system-on-chips (MPSoCs). However, customiza...
Sudeep Pasricha, Young-Hwan Park, Fadi J. Kurdahi,...