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» Linking codesign and reuse in embedded systems design
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VLSID
2006
IEEE
192views VLSI» more  VLSID 2006»
14 years 1 months ago
Beyond RTL: Advanced Digital System Design
This tutorial focuses on advanced techniques to cope with the complexity of designing modern digital chips which are complete systems often containing multiple processors, complex...
Shiv Tasker, Rishiyur S. Nikhil
CODES
2006
IEEE
14 years 1 months ago
Generic netlist representation for system and PE level design exploration
Designer productivity and design predictability are vital factors for successful embedded system design. Shrinking time-to-market and increasing complexity of these systems requir...
Bita Gorjiara, Mehrdad Reshadi, Pramod Chandraiah,...
SAMOS
2007
Springer
14 years 1 months ago
A Model-Driven Automatically-Retargetable Debug Tool for Embedded Systems
Abstract. Contemporary SoC designs ask for system-level debugging tools suitable to heterogeneous platforms. Such tools will have to rely on some low-level model-driven debugging e...
Max R. de O. Schultz, Alexandre K. I. Mendon&ccedi...
ICCAD
1998
IEEE
95views Hardware» more  ICCAD 1998»
13 years 12 months ago
Control generation for embedded systems based on composition of modal processes
In traditional distributed embedded system designs, control information is often replicated across several processes and kept coherent by application-specific mechanisms. Conseque...
Pai H. Chou, Ken Hines, Kurt Partridge, Gaetano Bo...
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 2 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...