55 search results - page 9 / 11 » Lithography Driven Layout Design |
DAC
2001
ACM
14 years 11 months ago
2001
ACM
In this paper, we study the problem of performance-driven multi-level circuit clustering with application to hierarchical FPGA designs. We first show that the performance-driven m...
ISQED
2005
IEEE
14 years 4 months ago
2005
IEEE
With continued aggressive process scaling in the subwavelength lithographic regime, resolution enhancement techniques (RETs) such as optical proximity correction (OPC) are an inte...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Leakage power is a serious concern in nanometer CMOS technologies. In this paper we focus on leakage reduction through automatic insertion of sleep transistors for power gating in...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
DOCENG
2008
ACM
14 years 19 days ago
2008
ACM
"There will always (I hope) be print books, but just as the advent of photography changed the role of painting or film changed the role of theater in our culture, electronic ...