980 search results - page 22 / 196 » Logical Testing |
ICCAD
2010
IEEE
13 years 4 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
CALCO
2007
Springer
13 years 11 months ago
2007
Springer
Specification-based testing is a particular case of black-box testing, which consists in deriving test cases from an analysis of a formal specification. We present in this paper an...
GLVLSI
2010
IEEE
14 years 11 days ago
2010
IEEE
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
TABLEAUX
2005
Springer
14 years 1 months ago
2005
Springer
The Intuitionistic Logic Theorem Proving (ILTP) Library provides a platfom for testing and benchmarking theorem provers for first-order intuitionistic logic. It includes a collect...
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...