980 search results - page 34 / 196 » Logical Testing |
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detec...
IOLTS
2003
IEEE
14 years 25 days ago
2003
IEEE
The paper describes a specific method for designing selfchecking checkers for m-out-of-n codes. The method is oriented to the Field Programmable Gate Arrays technology and is base...
DATE
2002
IEEE
14 years 16 days ago
2002
IEEE
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
PTS
2007
13 years 9 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...