With the increasing power density and heat-dissipation cost of modern VLSI designs, thermal and power integrity has become serious concern. Although the impacts of thermal effects...
Ting-Yuan Wang, Jeng-Liang Tsai, Charlie Chung-Pin...
In order to enable efficient integration of FPGAs into cost effective and reliable high-performance systems as well potentially into low power mobile systems, their power efficienc...
High power consumption not only leads to short battery life for handheld devices, but also causes on-chip thermal and reliability problems in general. As power consumption is prop...
Huaizhi Wu, I-Min Liu, Martin D. F. Wong, Yusu Wan...
- In this article, we explore the impact of strain on circuit performance when strained silicon (s-Si) devices are used for designing low-power high-speed circuits. Emphasis has be...
H. Ramakrishnan, K. Maharatna, S. Chattopadhyay, A...
— The goal of transistor reordering for a logic gate is to reduce the propagation delay as well as the charging and discharging of internal capacitances to achieve low power cons...