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ASPDAC
2006
ACM
135views Hardware» more  ASPDAC 2006»
15 years 10 months ago
Robust analytical gate delay modeling for low voltage circuits
— Sakurai-Newton (SN) delay metric [1] is a widely used closed form delay metric for CMOS gates because of simplicity and reasonable accuracy. Nevertheless it can be shown that t...
Anand Ramalingam, Sreekumar V. Kodakara, Anirudh D...
ICCAD
2001
IEEE
143views Hardware» more  ICCAD 2001»
16 years 29 days ago
Transient Power Management Through High Level Synthesis
The use of nanometer technologies is making it increasingly important to consider transient characteristics of a circuit’s power dissipation (e.g., peak power, and power gradien...
Vijay Raghunathan, Srivaths Ravi, Anand Raghunatha...
PVLDB
2010
164views more  PVLDB 2010»
15 years 2 months ago
FlashStore: High Throughput Persistent Key-Value Store
We present FlashStore, a high throughput persistent keyvalue store, that uses flash memory as a non-volatile cache between RAM and hard disk. FlashStore is designed to store the ...
Biplob Debnath, Sudipta Sengupta, Jin Li
VLSID
2006
IEEE
183views VLSI» more  VLSID 2006»
15 years 10 months ago
Design Challenges for High Performance Nano-Technology
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
Goutam Debnath, Paul J. Thadikaran
HPCA
2007
IEEE
16 years 4 months ago
Thermal Herding: Microarchitecture Techniques for Controlling Hotspots in High-Performance 3D-Integrated Processors
3D integration technology greatly increases transistor density while providing faster on-chip communication. 3D implementations of processors can simultaneously provide both laten...
Kiran Puttaswamy, Gabriel H. Loh