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ISCAS
1995
IEEE
107views Hardware» more  ISCAS 1995»
15 years 9 months ago
Power Dissipation in Deep Submicron CMOS Digital Circuits
— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...
R. X. Gu, Mohamed I. Elmasry
DFT
2003
IEEE
106views VLSI» more  DFT 2003»
15 years 11 months ago
Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
Atul Maheshwari, Israel Koren, Wayne Burleson
ICCAD
2003
IEEE
175views Hardware» more  ICCAD 2003»
16 years 2 months ago
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Abhishek Singh, Jitin Tharian, Jim Plusquellic
ASPDAC
1995
ACM
104views Hardware» more  ASPDAC 1995»
15 years 9 months ago
Power analysis of a 32-bit embedded microcontroller
A new approach for power analysis of microprocessorshas recently been proposed [1]. The idea is to look at the power consumption in a microprocessor from the point of view of the ...
Vivek Tiwari, Mike Tien-Chien Lee
DFT
2006
IEEE
92views VLSI» more  DFT 2006»
15 years 12 months ago
Low-Cost Hardening of Image Processing Applications Against Soft Errors
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...
Ilia Polian, Bernd Becker, Masato Nakasato, Satosh...