— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
A new approach for power analysis of microprocessorshas recently been proposed [1]. The idea is to look at the power consumption in a microprocessor from the point of view of the ...
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...
Ilia Polian, Bernd Becker, Masato Nakasato, Satosh...