102 search results - page 12 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
DAC
2002
ACM
14 years 9 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
VLSID
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ER
2007
Springer
14 years 2 months ago
2007
Springer
The longstanding problem of automatic table interpretation still illudes us. Its solution would not only be an aid to table processing applications such as large volume table conve...
ISMVL
2007
IEEE
14 years 2 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
AAAI
2008
13 years 11 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...