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DATE
2009
IEEE
78views Hardware» more  DATE 2009»
14 years 2 months ago
QC-Fill: An X-Fill method for quick-and-cool scan test
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
Chao-Wen Tzeng, Shi-Yu Huang
IMC
2007
ACM
13 years 9 months ago
Compressed network monitoring for ip and all-optical networks
We address the problem of efficient end-to-end network monitoring of path metrics in communication networks. Our goal is to minimize the number of measurements or monitors requir...
Mark Coates, Yvan Pointurier, Michael Rabbat
ICIP
2006
IEEE
14 years 9 months ago
An Architecture for Compressive Imaging
Compressive Sensing is an emerging field based on the revelation that a small group of non-adaptive linear projections of a compressible signal contains enough information for rec...
Michael B. Wakin, Jason N. Laska, Marco F. Duarte,...
DAC
2003
ACM
14 years 18 days ago
Test application time and volume compression through seed overlapping
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
ASPLOS
2010
ACM
14 years 2 months ago
Conservation cores: reducing the energy of mature computations
Growing transistor counts, limited power budgets, and the breakdown of voltage scaling are currently conspiring to create a utilization wall that limits the fraction of a chip tha...
Ganesh Venkatesh, Jack Sampson, Nathan Goulding, S...