19 search results - page 3 / 4 » March Tests for Word-Oriented Memories |
MTDT
2002
IEEE
14 years 12 days ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...