1813 search results - page 50 / 363 » Measuring the Effectiveness of Software Testing |
APGV
2008
ACM
13 years 9 months ago
2008
ACM
simulations compare to similar measurements done in more abstract settings. We find that participant tolerance for certain types of errors is significantly higher in a realistic sn...
MJ
2007
13 years 7 months ago
2007
In this paper we report on the mechanism of delamination in light-emitting diode (LED) packages and its effects on thermal characteristics of LEDs. The LED samples were subjected ...
COMSNETS
2012
12 years 3 months ago
2012
—Researchers choosing to share wireless-network traces with colleagues must first anonymize sensitive information, trading off the removal of information in the interest of iden...
VLSID
2000
IEEE
14 years 8 hour ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...