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120
Voted
VTS
2002
IEEE
15 years 7 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
113
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DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
We propose a novel methodology to generate Application Specific Instruction Processors (ASIPs) including custom instructions. Our implementation balances performance and area req...
ISSS
1999
IEEE
15 years 7 months ago
1999
IEEE
Portable or embedded systems allow more and more complex applications like multimedia today. These applications and submicronic technologies have made the power consumption criter...
115
Voted
VLSID
2009
IEEE
16 years 3 months ago
2009
IEEE
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...