16 search results - page 3 / 4 » Microprocessor Software-Based Self-Testing |
IOLTS
2002
IEEE
14 years 11 days ago
2002
IEEE
A silicon independent C-Based model of the TTP/C protocol was implemented within the EU-founded project FIT. The C-based model is integrated in the C-Sim simulation environment. T...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents STEPS, an innovative softwarebased approach for testing P1500-compliant SoCs. STEPS is based on the concept that the ATE is not considered as an initiator appl...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
ETS
2007
IEEE
13 years 9 months ago
2007
IEEE
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...