53 search results - page 9 / 11 » Multilevel Monte Carlo Path Simulation |
WCNC
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract—In this paper, we propose an output-threshold multiple relay selection scheme for dual-hop multi-branch cooperative wireless networks. The proposed scheme selects the ï¬...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
CG
2008
Springer
13 years 7 months ago
2008
Springer
Particle-based simulation methods are used to model a wide range of complex phenomena and to solve time-dependent problems of various scales. Effective visualizations of the resul...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...