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DAC
2008
ACM
14 years 11 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2007
ACM
14 years 11 months ago
MP-trees: A Packing-Based Macro Placement Algorithm for Mixed-Size Designs
In this paper, we present a new multi-packing tree (MP-tree) representation for macro placement to handle mixed-size designs. Based on binary trees, the MP-tree is very efficient,...
Tung-Chieh Chen, Ping-Hung Yuh, Yao-Wen Chang, Fwu...
DAC
2007
ACM
14 years 11 months ago
Gate Sizing For Cell Library-Based Designs
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
Shiyan Hu, Mahesh Ketkar, Jiang Hu
DAC
1998
ACM
14 years 11 months ago
Performance Driven Multi-Layer General Area Routing for PCB/MCM Designs
In this paper we present a new global router appropriate for Multichip Module MCM and dense Printed Circuit Board PCB design, which utilizes a hybrid of the classical rip-up and r...
Jason Cong, Patrick H. Madden
DAC
1999
ACM
14 years 11 months ago
Effective Iterative Techniques for Fingerprinting Design IP
While previous watermarking-based approaches to intellectual property protection (IPP) have asymmetrically emphasized the IP provider's rights, the true goal of IPP is to ens...
Andrew E. Caldwell, Hyun-Jin Choi, Andrew B. Kahng...
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