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ET
2006
120views more  ET 2006»
13 years 9 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
14 years 2 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
14 years 1 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...