Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
Sci2ools
International Keyboard
Graphical Social Symbols
CSS3 Style Generator
OCR
Web Page to Image
Web Page to PDF
Merge PDF
Split PDF
Latex Equation Editor
Extract Images from PDF
Convert JPEG to PS
Convert Latex to Word
Convert Word to PDF
Image Converter
PDF Converter
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
980
search results - page 17 / 196
»
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
Sort
relevance
views
votes
recent
update
View
thumb
title
24
click to vote
ET
2006
120
views
more
ET 2006
»
Automatic Test Pattern Generation for Resistive Bridging Faults
13 years 9 months ago
Download
ira.informatik.uni-freiburg.de
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
claim paper
Read More »
18
click to vote
ICCAD
2004
IEEE
99
views
Hardware
»
more
ICCAD 2004
»
SPIN-TEST: automatic test pattern generation for speed-independent circuits
14 years 6 months ago
Download
www.eng.yale.edu
Feng Shi, Yiorgos Makris
claim paper
Read More »
13
click to vote
DATE
2003
IEEE
62
views
Hardware
»
more
DATE 2003
»
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
14 years 2 months ago
Download
www.date-conference.com
Marcelino B. Santos, José M. Fernandes, Isa...
claim paper
Read More »
21
click to vote
GLVLSI
1997
IEEE
92
views
VLSI
»
more
GLVLSI 1997
»
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
14 years 1 months ago
Download
www.cecs.uci.edu
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
claim paper
Read More »
21
click to vote
ICCAD
1995
IEEE
76
views
Hardware
»
more
ICCAD 1995
»
Design verification via simulation and automatic test pattern generation
14 years 22 days ago
Download
www.ece.ucdavis.edu
Hussain Al-Asaad, John P. Hayes
claim paper
Read More »
« Prev
« First
page 17 / 196
Last »
Next »