980 search results - page 22 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
VLSID
2010
IEEE
13 years 7 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
ICCAD
1995
IEEE
14 years 22 days ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
ESOP
2012
Springer
12 years 4 months ago
2012
Springer
Abstract. MapReduce, being inspired by the map and reduce primitives available in many functional languages, is the de facto standard for large scale data-intensive parallel progra...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...