980 search results - page 29 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
— This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which t...
ICRA
2010
IEEE
13 years 7 months ago
2010
IEEE
— We present here an original approach to test the feasibility of footsteps for a given walking pattern generator. It is based on a new approximation algorithm intended to cope w...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...