980 search results - page 33 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
MTDT
2000
IEEE
14 years 1 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
DAC
1996
ACM
14 years 1 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
VTS
1999
IEEE
14 years 1 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...