980 search results - page 52 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ASPDAC
2005
ACM
13 years 11 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
ASPDAC
2009
ACM
14 years 3 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
RSP
1998
IEEE
14 years 1 months ago
1998
IEEE
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
ICCAD
2000
IEEE
14 years 1 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
VTS
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...