980 search results - page 9 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ICCAD
2000
IEEE
14 years 1 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
VTS
2005
IEEE
14 years 2 months ago
2005
IEEE
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
TAP
2010
Springer
14 years 2 months ago
2010
Springer
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...