43 search results - page 2 / 9 » On Applying Incremental Satisfiability to Delay Fault Testin... |
JISE
2000
13 years 10 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ASPDAC
2007
ACM
14 years 2 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
VTS
2007
IEEE
14 years 5 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
ASPDAC
2004
ACM
14 years 4 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...