372 search results - page 8 / 75 » On Fault Testing for Reversible Circuits |
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
DAC
1998
ACM
14 years 24 days ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
ATS
1998
IEEE
14 years 25 days ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
ICCAD
1998
IEEE
14 years 25 days ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...