: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
RSA-CRT fault attacks have been an active research area since their discovery by Boneh, DeMillo and Lipton in 1997. We present alternative key-recovery attacks on RSA-CRT signature...
Eric Brier, David Naccache, Phong Q. Nguyen, Mehdi...
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
—This paper proposes a novel fault-propagation pattern based differential fault analysis method - FPP-DFA, and proves its feasibility on SPN structure block ciphers using bitwise...
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...