90 search results - page 8 / 18 » On Optimal Tolerancing in Computer-Aided Design |
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
This paper presents a novel partial assignment technique (PAT) that decides which tasks should be assigned to the same resource without explicitly defining assignment of these tas...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Ever-growing complexity is forcing design to move above RTL. For example, golden functional models are being written as clearly as possible in software and not optimized or intend...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
The desynchronization approach combines a traditional synchronous specification style with a robust asynchronous implementation model. The main contribution of this paper is the d...