60 search results - page 3 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...