82 search results - page 11 / 17 » On Structural vs. Functional Testing for Delay Faults |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
STVR
2010
13 years 2 months ago
2010
As we move to developing object-oriented programs, the complexity traditionally found in functions and procedures is moving to the connections among components. Different faults o...
DAC
2006
ACM
13 years 9 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
The BIST implementation of a conventionally synthesized controller in most cases requires the integration of an additional register only for test purposes. This leads to some seri...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...