82 search results - page 6 / 17 » On Structural vs. Functional Testing for Delay Faults |
ATS
2003
IEEE
14 years 28 days ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
ISMVL
2007
IEEE
14 years 1 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
A fault fj is said to dominate another fault fi if all tests for fi detect fj . When two faults dominate each other, they are called equivalent. Dominance and equivalence relation...