100 search results - page 14 / 20 » On hierarchical statistical static timing analysis |
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
FPGA
2007
ACM
14 years 4 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
SAC
2005
ACM
14 years 3 months ago
2005
ACM
In this paper we present an investigation into the run-time behaviour of objects in Java programs, using specially adapted coupling metrics. We identify objects from the same clas...
FAST
2011
13 years 1 months ago
2011
As file systems reach the petabytes scale, users and administrators are increasingly interested in acquiring highlevel analytical information for file management and analysis. T...