305 search results - page 36 / 61 » On modeling top-down VLSI design |
VLSID
2000
IEEE
13 years 12 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
VLSI
2010
Springer
13 years 2 months ago
2010
Springer
Future systems will have to support multiple and concurrent dynamic compute-intensive applications, while respecting real-time and energy consumption constraints. To overcome these...
SLIP
2005
ACM
14 years 1 months ago
2005
ACM
Routability optimization has become a major concern in the physical design cycle of VLSI circuits. Due to the recent advances in VLSI technology, interconnect has become a dominan...
GLVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
Phase-based tuning methodologies specialize system parameters for each application phase of execution. Parameters are varied during execution, as opposed to remaining fixed as in ...
ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...