96 search results - page 1 / 20 » On test coverage of path delay faults |
ICCAD
2003
IEEE
14 years 7 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
VLSID
1996
IEEE
14 years 3 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
DATE
2002
IEEE
14 years 3 months ago
2002
IEEE
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
VTS
2000
IEEE
14 years 3 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...