7 search results - page 1 / 2 » On test generation for transition faults with minimized peak... |
DAC
2004
ACM
14 years 8 days ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
ASPDAC
2007
ACM
14 years 16 days ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
EVOW
1999
Springer
14 years 25 days ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
VTS
2000
IEEE
14 years 28 days ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
VTS
2006
IEEE
14 years 2 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...