166 search results - page 28 / 34 » On testing delay faults in macro-based combinational circuit... |
ATS
1998
IEEE
14 years 1 days ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
VTS
1999
IEEE
14 years 1 days ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
EURODAC
1994
IEEE
13 years 12 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
ICCAD
1999
IEEE
14 years 2 days ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...