166 search results - page 30 / 34 » On testing delay faults in macro-based combinational circuit... |
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally ef...
ISLPED
2007
ACM
13 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
TCAD
2010
13 years 2 months ago
2010
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and re...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...