372 search results - page 24 / 75 » On the Fault Testing for Reversible Circuits |
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
A fault fj is said to dominate another fault fi if all tests for fi detect fj . When two faults dominate each other, they are called equivalent. Dominance and equivalence relation...
ASYNC
2000
IEEE
14 years 1 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
DATE
1999
IEEE
14 years 28 days ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
ITC
1997
IEEE
14 years 4 days ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
ITC
2002
IEEE
14 years 1 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...