372 search results - page 47 / 75 » On the Fault Testing for Reversible Circuits |
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
VTS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...