261 search results - page 13 / 53 » Optimal Hardware Pattern Generation for Functional BIST |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
Genetic Algorithms (GAs) are very commonly used as function optimizers, basically due to their search capability. A number of different serial and parallel versions of GA exist. ...
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
We present a simulation-based semi-formal verification method for sequential circuits described at the registertransfer level. The method consists of an iterative loop where cove...
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...