251 search results - page 17 / 51 » Optimized maintenance design for manufacturing performance i... |
ICCAD
2007
IEEE
14 years 6 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
TCAD
2008
13 years 9 months ago
2008
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
ATS
2004
IEEE
14 years 25 days ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
GLVLSI
2009
IEEE
14 years 3 months ago
2009
IEEE
In this paper, we propose novel architectural and design techniques for three-dimensional field-programmable gate arrays (3D FPGAs) with Through-Silicon Vias (TSVs). We develop a...
APSEC
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a discrete simulation model for software projects which explicitly takes a scheduling strategy as input. The model represents varying staff skill levels, component coup...