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DAC
2011
ACM
12 years 7 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li
ASPDAC
2010
ACM
161views Hardware» more  ASPDAC 2010»
13 years 5 months ago
Novel dual-Vth independent-gate FinFET circuits
This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enabl...
Masoud Rostami, Kartik Mohanram
ISCA
2002
IEEE
105views Hardware» more  ISCA 2002»
14 years 13 days ago
Power and Performance Evaluation of Globally Asynchronous Locally Synchronous Processors
Due to shrinking technologies and increasing design sizes, it is becoming more difficult and expensive to distribute a global clock signal with low skew throughout a processor di...
Anoop Iyer, Diana Marculescu
ASPDAC
2009
ACM
159views Hardware» more  ASPDAC 2009»
14 years 5 days ago
Congestion-aware power grid optimization for 3D circuits using MIM and CMOS decoupling capacitors
— In three-dimensional (3D) chips, the amount of supply current per package pin is significantly more than in two-dimensional (2D) designs. Therefore, the power supply noise pro...
Pingqiang Zhou, Karthikk Sridharan, Sachin S. Sapa...
HPCA
2003
IEEE
14 years 7 months ago
Deterministic Clock Gating for Microprocessor Power Reduction
With the scaling of technology and the need for higher performance and more functionality, power dissipation is becoming a major bottleneck for microprocessor designs. Pipeline ba...
Hai Li, Swarup Bhunia, Yiran Chen, T. N. Vijaykuma...