257 search results - page 4 / 52 » Packet-Based Input Test Data Compression Techniques |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—This paper describes a waveform compression technique suitable for the efficient utilization, storage and interchange of the emerging current source model (CSM) based cell libra...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ATS
2003
IEEE
14 years 19 days ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...