149 search results - page 23 / 30 » Parametric Fault Simulation and Test Vector Generation |
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
TSP
2010
13 years 2 months ago
2010
A parametric generalized likelihood ratio test (GLRT) for multichannel signal detection in spatially and temporally colored disturbance was recently introduced by modeling the dist...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
ICCAD
1999
IEEE
13 years 11 months ago
1999
IEEE
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
ISSRE
2000
IEEE
13 years 11 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...