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DFT
2003
IEEE
100views VLSI» more  DFT 2003»
14 years 1 months ago
Scan-Based BIST Diagnosis Using an Embedded Processor
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
Kedarnath J. Balakrishnan, Nur A. Touba
DATE
2010
IEEE
148views Hardware» more  DATE 2010»
14 years 1 months ago
Scalable stochastic processors
Abstract—Future microprocessors increasingly rely on an unreliable CMOS fabric due to aggressive scaling of voltage and frequency, and shrinking design margins. Fortunately, many...
Sriram Narayanan, John Sartori, Rakesh Kumar, Doug...
DSN
2002
IEEE
14 years 1 months ago
Detecting Processor Hardware Faults by Means of Automatically Generated Virtual Duplex Systems
A virtual duplex system (VDS) can be used to increase safety without the use of structural redundancy on a single machine. If a deterministic program P is calculating a given func...
Markus Jochim
DATE
2007
IEEE
91views Hardware» more  DATE 2007»
14 years 3 months ago
Transient fault prediction based on anomalies in processor events
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors decrease due to CMOS scaling. Prior techniques advocated full scale structural or...
Satish Narayanasamy, Ayse Kivilcim Coskun, Brad Ca...
ISCAS
2006
IEEE
129views Hardware» more  ISCAS 2006»
14 years 2 months ago
Computing during supply voltage switching in DVS enabled real-time processors
In recent times, much attention has been devoted to power optimization for real-time systems, while guaranteeing that such systems meet their hard (or soft) scheduling deadlines. ...
Chunjie Duan, Sunil P. Khatri