35 search results - page 2 / 7 » Pattern generation for a deterministic BIST scheme |
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ASPDAC
2001
ACM
13 years 10 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...