5799 search results - page 37 / 1160 » Patterns Generate Architectures |
ITC
1997
IEEE
14 years 3 days ago
1997
IEEE
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...
IOLTS
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
ICRA
2002
IEEE
14 years 25 days ago
2002
IEEE
A method of running pattern generation for a humanoid robot using the dynamics of a simple inverted pendulum is proposed. Dynamic simulation using a model of an actual humanoid ro...
FLAIRS
2007
13 years 10 months ago
2007
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
SAC
2010
ACM
14 years 2 months ago
2010
ACM
In many application fields, huge binary datasets modeling real life-phenomena are daily produced. The dataset records are usually associated with observations of some events, and...